Archivo de la categoría: ARTIFICIAL VISION

PRACTICE 1 – DETECTING COMPONENTS WITH ARTIFICIAL VISION

In this practice I’m going to show the trial to detect components (resistor, capacitor, transistor and diode) with the Vision Builder of National Instruments.

The first step, when you have created a new inspection, is the image acquiring from the camera (GigE Vision or IEEE 1394 camera) . With this instruction you can also configurate the camera atributtes like brightness, contrast, saturation, color, etc.

Then I have used an instruction configurated to extract the red plane since the inspection is easier to work in black and white.

Here is a pic of the image adquisition:

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In the next step you can see the classification of the different components:

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You have to create and edit the classifier file where you will save the samples of the components to find. First, in the Add Samples label, add a class (p.e: RES) and select the component from the ROI to add the sample.

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And then, in the Classify label, you have to click the “Train Classifier” button to learn the sample of the component.

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Save and close the document and you can continue customizing the inspection with the Overlay Custom instruction to end the project.

This is a pic when the inspection fails becouse there aren’t components enough:

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And there are some pictures when the inspection passes becouse there are enough components:

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